Scanning Electron Microscope (SEM)
Location: Room 3097 in the Earth Sciences Centre
Look here to find the booking calendar
Look here for the job request form
The Scanning Electron Microscope (SEM) is an electron beam type of instrument, similar to the Electron Microprobe. Its most common application is the imaging of three dimensional objects by means of Secondary Electrons (SE), but compositional imaging by means of Backscattered Electrons (BSE) has also become standard. Frequently, X-ray microanalysis capabilities are also available,most commonly by means of a solid state Energy Dispersive Spectrometry (EDS) system and/or, less frequently, a Wavelength Dispersive Spectrometry (WDS) arrangement.
Our SEM is a JEOL JSM6610-Lv, complemented by an Oxford/SDD EDS detector (ultra thin window) allowing for X-ray microanalysis and digital imaging via SE, BSE, and X-ray signals.
In addition to SE, BSE, and X-ray capabilities this SEM has a MiniCL by Gatan attached to it, a simple but effective cathodoluminescene (CL) imaging system.
Current Fee Structure
|Time / user type||Earth Sciences Department NSERC Users||dept. other grants, U of T users||other university users||contract users|
on-peak (9am to 5pm) weekdays
off-peak time (5pm – 9am weekdays and all weekend time)
The above rates do not include applicable taxes nor an operator. Basic operator training (a few hours only are necessary) is available at no cost. Specific needs requiring us to supply an operator will be considered, and an additional charge is made for operator assistance.
Note: A Job request form can be found here in PDF format. This form must be filled out completely and signed when submitting your work request.
You will need Adobe’s Acrobat Reader® to open the job request form. You may download it, at no charge, from Adobe Systems.
Dr. M. Gorton
Tel (416) 946-5309
Fax (416) 978-3938
You may want to check other Web sites for info on SEM. The following could be a start: