Electron Probe X-Ray Microanalyzer (EMPA) Laboratory

Home

 

The Department of Earth Sciences Electron Probe X-Ray Microanalyzer (EMPA) Laboratory is a departmental facility that offers analytical training and services to members of the Earth Sciences Department, other University researchers and some commercial clients.

Booking the equipment and receiving appropriate training before using the microprobe is mandatory. 

Use the blue menu bar above to find out how to contact us, learn about the equipment and services available in the lab and to view the booking calendar. Please also check out the Gallery tab to see pictures of recent application examples.

 


 

NEW FEATURE (starting Jan 2017)! 

For long distance users, you do not have to come to the lab to set up your probe points. Remote access is available now!

Probe users can now mail their samples to us and pick your points remotely at home! (Windows system only)

Contact the probe technician about more details!

 


JXA-8230

picture from JEOL USA

Our probe lab has been recently upgraded with a new JEOL JXA8230 5-WDS electron microprobe.

Exciting new features, including but not limited to:

1) 5 WDS, which would cut the counting time into halves;

2) Improved EDS system detecting B~U;

2) Fully integrated WDS and EDS system, which enables major elements measurements by EDS, trace by WDS to save even more time;

3) Integrated imaging package, which will better record the probed locations and make  “mapping with WDS” become possible;

4) Optional Xenon detector and special spectrometer with smaller Rowland circle which enhances the count rates for metals;

5) Stage holder with greater capacities and tolerance;


Other JXA-8230 Key Product Features (from JEOL USA)

Detectable element range 4 Be to 92 U
Detectable wavelength range 0.087 to 9.3nm
Number of X-ray spectrometers 5 (Plus EDS)
Specimen size 150mm x 150mm x 50mm
X – Y Range

90mm x 90mm

Specimen stage drive speed 15mm/s max
Accelerating voltage 0.2 to 30kV (100V steps)
Probe current range 10 -12 to 10 -5 A
Probe current stability 1 x 10-3 /h
BEI (backscattered electron image) TOPO and COMPO
Scanning image magnification x40 to 300,000 (WD: 11mm)